Effect of thickness on the structural and optical properties of CuO thin films grown by successive ionic layer adsorption and reaction


Akaltun Y.

THIN SOLID FILMS, vol.594, pp.30-34, 2015 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 594
  • Publication Date: 2015
  • Doi Number: 10.1016/j.tsf.2015.10.003
  • Journal Name: THIN SOLID FILMS
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.30-34
  • Erzincan Binali Yildirim University Affiliated: Yes

Abstract

CuO thin films were synthesised on glass substrates at room temperature using successive ionic layer adsorption and reaction (SILAR) method. The effect of film thickness on characteristic parameters such as the structural, morphological and optical properties of the films was investigated. The X-ray diffraction (XRD) and scanning electron microscopy (SEM) studies showed that all of the films exhibited polycrystalline structure with monoclinic phases and covered the glass substrates well. The crystalline and morphology of the films improved with increasing film thickness. The optical band gap decreased from 2.03 to 1.79 eV depending on the film thickness. The refractive index (n), electron effective mass (m*(e)/m(o)) and static and frequency dielectric constants (epsilon(o), epsilon(infinity)) were determined using the energy band gap values. (C) 2015 Elsevier B.V. All rights reserved.