Effect of thickness on the structural and optical properties of CuO thin films grown by successive ionic layer adsorption and reaction


THIN SOLID FILMS, cilt.594, ss.30-34, 2015 (SCI İndekslerine Giren Dergi) identifier identifier

  • Cilt numarası: 594
  • Basım Tarihi: 2015
  • Doi Numarası: 10.1016/j.tsf.2015.10.003
  • Sayfa Sayıları: ss.30-34


CuO thin films were synthesised on glass substrates at room temperature using successive ionic layer adsorption and reaction (SILAR) method. The effect of film thickness on characteristic parameters such as the structural, morphological and optical properties of the films was investigated. The X-ray diffraction (XRD) and scanning electron microscopy (SEM) studies showed that all of the films exhibited polycrystalline structure with monoclinic phases and covered the glass substrates well. The crystalline and morphology of the films improved with increasing film thickness. The optical band gap decreased from 2.03 to 1.79 eV depending on the film thickness. The refractive index (n), electron effective mass (m*(e)/m(o)) and static and frequency dielectric constants (epsilon(o), epsilon(infinity)) were determined using the energy band gap values. (C) 2015 Elsevier B.V. All rights reserved.