Fabrication of CdO thin films with SILAR: Influence of annealing temperature on physical properties

Taşdemirci T.

Journal of Nanoparticle Research, cilt.27, sa.4, 2025 (SCI-Expanded, Scopus) identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 27 Sayı: 4
  • Basım Tarihi: 2025
  • Doi Numarası: 10.1007/s11051-025-06274-6
  • Dergi Adı: Journal of Nanoparticle Research
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, PASCAL, Biotechnology Research Abstracts, Compendex, INSPEC, Metadex
  • Anahtar Kelimeler: Annealing Temperature, CdO, SILAR, Thin film
  • Erzincan Binali Yıldırım Üniversitesi Adresli: Evet

Özet

Cadmium oxide (CdO) thin film was grown on a glass substrate at room temperature using the Successive ionic layer adsorption and reaction (SILAR) method. The grown thin films were annealed at 3500C and 4000C for 30 min. Structural and optical properties of CdO thin films after annealing were examined. Analyzes were made with X-ray diffractometer (XRD) and Scanning electron microscope-Energy dispersive X-ray spectroscopy (SEM-EDAX) devices for structural properties, and UV–Vis devices for optical properties. The XRD peak intensities of CdO thin films exposed to annealing temperature increased and the crystal structure improved. The bandgap energy range decreased from 2.48 eV to 2.37 eV with the effect of annealing temperature.