Akademik Veri Yönetim Sistemi
Applied Sciences (Switzerland), cilt.15, sa.12, 2025 (SCI-Expanded, Scopus)
Accurate and robust detection of fabric defects under noisy conditions is a major challenge in textile quality control systems. To address this issue, we introduce a new model called the Logarithmic Deep Residual Shrinkage Network (Log-DRSN), which integrates a deep attention module. Unlike standard residual shrinkage networks, the proposed Log-DRSN applies logarithmic transformation to improve resistance to noise, particularly in cases with subtle defect features. The model is trained and tested on both clean and artificially noised images to mimic real-world manufacturing conditions. The experimental results reveal that Log-DRSN achieves superior accuracy and robustness compared to the classical DRSN, with performance scores of 0.9917 on noiseless data and 0.9640 on noisy data, whereas the classical DRSN achieves 0.9686 and 0.9548, respectively. Despite its improved performance, the Log-DRSN introduces only a slight increase in computation time. These findings highlight the model’s potential for practical deployment in automated fabric defect inspection.