X- and gamma-ray irradiation effects on vanadium pentoxide thin films

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YILMAZ D., GÜZELDİR B., AKKUŞ T., ÖZNÜLÜER T.

SPECTROSCOPY LETTERS, vol.51, no.6, pp.297-301, 2018 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 51 Issue: 6
  • Publication Date: 2018
  • Doi Number: 10.1080/00387010.2018.1475397
  • Journal Name: SPECTROSCOPY LETTERS
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.297-301
  • Erzincan Binali Yildirim University Affiliated: Yes

Abstract

Thickness and composition of thin films can be measured with X- and gamma-rays. In this work, thickness and composition of vanadium pentoxide thin films are investigated by energy dispersive and wavelength dispersive X-ray fluorescence systems. Also, the surface analysis of vanadium pentoxide thin films irradiated with Rhodium K X-rays and 59.54keV gamma-rays emitted from 100mCi and 5Ci Americium-241 radioactive sources is performed by scanning electron microscope. It is observed that X- and gamma-rays are destructive for vanadium pentoxide thin films. Also, the composition of vanadium pentoxide thin films changes by irradiation with X- and gamma-rays.