X- and gamma-ray irradiation effects on vanadium pentoxide thin films

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YILMAZ D., GÜZELDİR B., AKKUŞ T., ÖZNÜLÜER T.

SPECTROSCOPY LETTERS, cilt.51, sa.6, ss.297-301, 2018 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 51 Sayı: 6
  • Basım Tarihi: 2018
  • Doi Numarası: 10.1080/00387010.2018.1475397
  • Dergi Adı: SPECTROSCOPY LETTERS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.297-301
  • Erzincan Binali Yıldırım Üniversitesi Adresli: Evet

Özet

Thickness and composition of thin films can be measured with X- and gamma-rays. In this work, thickness and composition of vanadium pentoxide thin films are investigated by energy dispersive and wavelength dispersive X-ray fluorescence systems. Also, the surface analysis of vanadium pentoxide thin films irradiated with Rhodium K X-rays and 59.54keV gamma-rays emitted from 100mCi and 5Ci Americium-241 radioactive sources is performed by scanning electron microscope. It is observed that X- and gamma-rays are destructive for vanadium pentoxide thin films. Also, the composition of vanadium pentoxide thin films changes by irradiation with X- and gamma-rays.