Effect of mechanical noise upon X-ray fluorescence analysis


YILMAZ D., PİRİMOĞLU DAL M., AKKUŞ T.

INSTRUMENTATION SCIENCE & TECHNOLOGY, cilt.47, ss.666-677, 2019 (SCI İndekslerine Giren Dergi) identifier identifier

  • Cilt numarası: 47 Konu: 6
  • Basım Tarihi: 2019
  • Doi Numarası: 10.1080/10739149.2019.1624262
  • Dergi Adı: INSTRUMENTATION SCIENCE & TECHNOLOGY
  • Sayfa Sayıları: ss.666-677

Özet

The effect of the external mechanical noise on energy dispersive X-ray fluorescence (EDXRF) spectra has been investigated. A Nd2O3 sample was bombarded by the gamma-rays of 59.54 keV energy. The annular radioactive source (americium-241) with intensity equal to 1 Curie was used. The intensities of characteristic x-rays emitted from the Nd2O3 sample were measured using a high purity germanium detector. The mechanical noise applied to the experimental system had intensity values of 50 dB, 60 dB, 70 dB, 80 dB, 90 dB, and 100 dB. A sound level meter (Model 8928) was used to measure the external mechanical noise levels. The net area (P), background intensity (B), peak-to-background ratio (P/B), and full width at half-maximum (FWHM) of the characteristic peaks were determined in the energy dispersive X-ray fluorescence spectra obtained from Nd2O3 sample. It was observed that the background intensities of and peaks of the sample increased with the increasing mechanical noise level. The peak-to-background ratios (P/B) and the peak resolution decreased with increasing mechanical noise level.