Akademik Veri Yönetim Sistemi
International Conference on Advance in Engineering, Architecture, Science and Technology, Erzurum, Türkiye, 15 Aralık 2021, ss.70-74, (Tam Metin Bildiri)
In this study, zinc oxide (ZnO) thin films are deposited on a silicon substrate by using Successive Ionic Layer Adsorption and Reaction (SILAR) and spin coating methods. Scanning electron microscopy (SEM) and X-ray diffraction (XRD) measurements are made to examine the surface morphologies and crystal structures of the obtained samples, respectively, and photoluminescence (PL) measurements are taken to investigate optical properties of the films. From the SEM measurements, it is observed that the surfaces are homogeneous and ZnO nano-rods are formed on the surfaces and the presence of ZnO peaks is confirmed from the XRD measurements. From the PL measurements, it is observed that the samples can emit light around 380 nm. The measurements reveal that the thin films deposited by spin coating method have better characteristics than deposited by SILAR method.