Aftermath of Ag embedding on structural, optical, and supercapacitor electrode attributes of USP-grown CuO thin films


GÜNEY H., İSKENDEROĞLU D., Güldüren M. E., Demir K. Ç., MORKOÇ KARADENİZ S.

Applied Physics A: Materials Science and Processing, cilt.130, sa.8, 2024 (SCI-Expanded) identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 130 Sayı: 8
  • Basım Tarihi: 2024
  • Doi Numarası: 10.1007/s00339-024-07732-z
  • Dergi Adı: Applied Physics A: Materials Science and Processing
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, Aerospace Database, Chemical Abstracts Core, Chimica, Communication Abstracts, Compendex, INSPEC, Metadex
  • Anahtar Kelimeler: Ag doped CuO, Supercapacitor, Ultrasonic spray pyrolysis, Uv-vis, XRD
  • Erzincan Binali Yıldırım Üniversitesi Adresli: Evet

Özet

Here, ultrasonic spray pyrolysis method (USP) was utilized to produce pure and silver doped copper oxide nanostructures on glass substrates. Thereafter, several characterization techniques were conducted on the grown samples to delve into their morphological, structural, electrochemical, and optical aspects. The mentioned analyses were carried out by performing x-ray photoelectron spectroscopy, scanning electron microscope, X-ray diffraction, electrochemical impedance spectroscopy, galvostatic charge-discharge, cyclic voltammetry, and UV–visible spectroscopy measurements. Thus, the impact of silver impurity doping on the relevant aspects of host material were recorded as well as the features of unspoiled copper oxide films. Accordingly, the samples, as indicated by X-ray diffraction results, possessed (002) preferential plane orientation of copper oxide material along with the crystallite sizes ranging from 52.52 nm to 75.02 nm due to the imperfections caused by the silver doping. The scanning electron microscope images exhibited that the silver doping did not form significant modifications in the host material morphology where nanowire-like structures observed. The presence of the suggested materials in the films was verified by the x-ray photoelectron spectroscopy. Also, the UV–visible spectroscopy measurements detected that optical absorbance edge and bandgap energy values red shifted as a result of the impurity doping. The electrochemical supercapacitors performances of the silver doped copper oxide nanostructured thin films were inspected by using the GCD, EIS, and CV. The silver doped copper oxide films demonstrated a specific capacitance value of 66 F/g at a current density of 1 A/g in 1 M KOH electrolyte. From Nyquist plot, Rs, Rcor, Rpo, Ccor and Cc were obtained as 2.327 × 103 Ω.cm2, 43.63 × 103 Ω.cm2, 4.580 × 103 Ω.cm2, 111.5 × 10-6 S*s^a. cm-2 and 101.1 × 10-6 S*s^a. cm-2, respectively. The results indicated that the electrochemically synthesized the silver doped copper oxide electrodes can be obtained and developed as an alternative electrode material for supercapacitors (SCs).