Emission probabilities of K X- and gamma-rays following Cr-51 and Ga-67 decay

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Yalcin P., KURUCU Y.

APPLIED RADIATION AND ISOTOPES, cilt.62, sa.1, ss.63-67, 2005 (SCI-Expanded, Scopus)

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 62 Sayı: 1
  • Basım Tarihi: 2005
  • Doi Numarası: 10.1016/j.apradiso.2004.05.078
  • Dergi Adı: APPLIED RADIATION AND ISOTOPES
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.63-67
  • Anahtar Kelimeler: Cr-51, Ga-67, X-rays emission probabilities, gamma-rays emission probabilities, electron capture processes, EFFICIENCY CALIBRATION, INTERNAL CONVERSION, ENERGY-RANGE, GE(LI)-SPECTROMETRY, CAPTURE, ZN67
  • Erzincan Binali Yıldırım Üniversitesi Adresli: Hayır

Özet

Emission probabilities of K X- and gamma-rays following the decay of Cr-51 and Ga-67 were precisely measured with a calibrated Si(Li) detector. The photopeak efficiency of the Si(Li) semiconductor detector was determined experimentally for about 4-400 keV energy range by using standard sources. Results of this study have been compared with the theoretical values and other available experimental results in the literature. Good agreement was observed between our results, and other available experimental results and theoretically calculated values. (C) 2004 Elsevier Ltd. All rights reserved.

Emission probabilities of K X- and g-rays following the decay of 51Cr and 67Ga were precisely measured with a calibrated Si(Li) detector. The photopeak efficiency of the Si(Li) semiconductor detector was determined experimentally for about 4–400 keV energy range by using standard sources. Results of this study have been compared with the theoretical values and other available experimental results in the literature. Good agreement was observed between our results, and other available experimental results and theoretically calculated values.