Emission probabilities of K X- and gamma-rays following Cr-51 and Ga-67 decay

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Yalcin P., KURUCU Y.

APPLIED RADIATION AND ISOTOPES, vol.62, no.1, pp.63-67, 2005 (SCI-Expanded) identifier identifier identifier

  • Publication Type: Article / Article
  • Volume: 62 Issue: 1
  • Publication Date: 2005
  • Doi Number: 10.1016/j.apradiso.2004.05.078
  • Journal Name: APPLIED RADIATION AND ISOTOPES
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.63-67
  • Keywords: Cr-51, Ga-67, X-rays emission probabilities, gamma-rays emission probabilities, electron capture processes, EFFICIENCY CALIBRATION, INTERNAL CONVERSION, ENERGY-RANGE, GE(LI)-SPECTROMETRY, CAPTURE, ZN67
  • Erzincan Binali Yildirim University Affiliated: No

Abstract

Emission probabilities of K X- and g-rays following the decay of 51Cr and 67Ga were precisely measured with a calibrated Si(Li) detector. The photopeak efficiency of the Si(Li) semiconductor detector was determined experimentally for about 4–400 keV energy range by using standard sources. Results of this study have been compared with the theoretical values and other available experimental results in the literature. Good agreement was observed between our results, and other available experimental results and theoretically calculated values.

Emission probabilities of K X- and gamma-rays following the decay of Cr-51 and Ga-67 were precisely measured with a calibrated Si(Li) detector. The photopeak efficiency of the Si(Li) semiconductor detector was determined experimentally for about 4-400 keV energy range by using standard sources. Results of this study have been compared with the theoretical values and other available experimental results in the literature. Good agreement was observed between our results, and other available experimental results and theoretically calculated values. (C) 2004 Elsevier Ltd. All rights reserved.