The effect of enhancement factor on the angular dependence of L x-ray intensity ratios for Sm, Hf, Pb and U

AKKUŞ T., YILMAZ D., Ugurlu M.

RADIATION PHYSICS AND CHEMISTRY, vol.166, 2020 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 166
  • Publication Date: 2020
  • Doi Number: 10.1016/j.radphyschem.2019.108499
  • Journal Name: RADIATION PHYSICS AND CHEMISTRY
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, Aerospace Database, Chimica, Communication Abstracts, Compendex, EMBASE, INSPEC, Metadex, Pollution Abstracts, Civil Engineering Abstracts
  • Erzincan Binali Yildirim University Affiliated: Yes

Abstract

The effect of enhancement factor on the angular dependence of L-l/L-gamma, L-alpha/L-gamma and L-beta/L-gamma X-ray intensity ratios for Sm, Hf, Pb and U elements have been measured by using the 59.54 keV photon energy. The binary systems are prepared as Sm-CeO2, Hf-CeO2, Pb-CeO2 and U-CePO2. The samples have been analyzed in EDXRF system. The measurements are made in scattering angles of 85 degrees, 95 degrees, 105 degrees, 115 degrees and 125 degrees. The L X-ray spectra from different samples were detected by a Si(Li) detector. The results show that the intensity ratios of L X-rays to be greater than expected due to the enhancement effect.