Characterization of SnO2 Thin Films deposited with SILAR: Effect of Annealing on Physical Properties

Taşdemirci T.

BRAZILIAN JOURNAL OF PHYSICS, vol.56, no.4, pp.1-8, 2026 (SCI-Expanded, Scopus)

  • Publication Type: Article / Article
  • Volume: 56 Issue: 4
  • Publication Date: 2026
  • Doi Number: 10.1007/s13538-026-02087-7
  • Journal Name: BRAZILIAN JOURNAL OF PHYSICS
  • Journal Indexes: Scopus, Science Citation Index Expanded (SCI-EXPANDED), INSPEC
  • Page Numbers: pp.1-8
  • Erzincan Binali Yildirim University Affiliated: Yes