Characterization of SnS thin films grown by SILAR method


AKALTUN Y., ASTAM A., YILDIRIM M. A., CERHAN A.

International Semiconductor Science & Technology Conference, İstanbul, Turkey, 13 - 15 January 2014, pp.104

  • Publication Type: Conference Paper / Full Text
  • City: İstanbul
  • Country: Turkey
  • Page Numbers: pp.104
  • Erzincan Binali Yildirim University Affiliated: Yes