Effect of Annealing Temperature on Structural and Optical Properties of NiO Thin Films Deposited by Silar Method | AVESİS

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Effect of Annealing Temperature on Structural and Optical Properties of NiO Thin Films Deposited by Silar Method

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Çayır T., AKALTUN Y., ASTAM A.

Science & Applications of Thin Films Conference & Exhibition, İzmir, Turkey, 19 September 2016

Publication Type: Conference Paper / Summary Text
City: İzmir
Country: Turkey
Erzincan Binali Yildirim University Affiliated: Yes