CİMİLLİ ÇATIR, F. E. Et Al. 2016. The Effect of Annealing on The Electrical Characterization of Cu n Type Inp Schottky Diodes C V Measurements as a Function of Sample Temperature. IPCAP 2016 .

CİMİLLİ ÇATIR, F. E., SAĞLAM, M., & TURUT, A., (2016). The Effect of Annealing on The Electrical Characterization of Cu n Type Inp Schottky Diodes C V Measurements as a Function of Sample Temperature . IPCAP 2016

CİMİLLİ ÇATIR, FULYA, MUSTAFA SAĞLAM, And ABDULMECİT TURUT. "The Effect of Annealing on The Electrical Characterization of Cu n Type Inp Schottky Diodes C V Measurements as a Function of Sample Temperature," IPCAP 2016, 2016

CİMİLLİ ÇATIR, FULYA E. Et Al. "The Effect of Annealing on The Electrical Characterization of Cu n Type Inp Schottky Diodes C V Measurements as a Function of Sample Temperature." IPCAP 2016 , 2016

CİMİLLİ ÇATIR, F. E. SAĞLAM, M. And TURUT, A. (2016) . "The Effect of Annealing on The Electrical Characterization of Cu n Type Inp Schottky Diodes C V Measurements as a Function of Sample Temperature." IPCAP 2016 .

@conferencepaper{conferencepaper, author={FULYA ESRA CİMİLLİ ÇATIR Et Al. }, title={The Effect of Annealing on The Electrical Characterization of Cu n Type Inp Schottky Diodes C V Measurements as a Function of Sample Temperature}, congress name={IPCAP 2016}, city={}, country={}, year={2016}}