CİMİLLİ ÇATIR, F. E. Et Al. 2016. The Effects of Annealing on The Electrical Characterization of Cu/n-Inp/In Schottky Diodes I-V Measurements as a function of Sample Temperature. IPCAP 2016 , (Erzurum, Turkey), 205.

CİMİLLİ ÇATIR, F. E., Sağlam, ., & Türüt, ., (2016). The Effects of Annealing on The Electrical Characterization of Cu/n-Inp/In Schottky Diodes I-V Measurements as a function of Sample Temperature . IPCAP 2016 (pp.205). Erzurum, Turkey

CİMİLLİ ÇATIR, FULYA, Mustafa Sağlam, And Abdulmecit Türüt. "The Effects of Annealing on The Electrical Characterization of Cu/n-Inp/In Schottky Diodes I-V Measurements as a function of Sample Temperature," IPCAP 2016, Erzurum, Turkey, 2016

CİMİLLİ ÇATIR, FULYA E. Et Al. "The Effects of Annealing on The Electrical Characterization of Cu/n-Inp/In Schottky Diodes I-V Measurements as a function of Sample Temperature." IPCAP 2016 , Erzurum, Turkey, pp.205, 2016

CİMİLLİ ÇATIR, F. E. Sağlam, . And Türüt, . (2016) . "The Effects of Annealing on The Electrical Characterization of Cu/n-Inp/In Schottky Diodes I-V Measurements as a function of Sample Temperature." IPCAP 2016 , Erzurum, Turkey, p.205.

@conferencepaper{conferencepaper, author={FULYA ESRA CİMİLLİ ÇATIR Et Al. }, title={The Effects of Annealing on The Electrical Characterization of Cu/n-Inp/In Schottky Diodes I-V Measurements as a function of Sample Temperature}, congress name={IPCAP 2016}, city={Erzurum}, country={Turkey}, year={2016}, pages={205} }